TY - JOUR
T1 - Thomson scattering measurements in low-density plasmas in the TST-2 spherical tokamak
AU - Togashi, H.
AU - Ejiri, A.
AU - Homma, H.
AU - Shinya, T.
AU - Takase, Y.
AU - Toida, K.
AU - Tsujii, N.
AU - Yamaguchi, T.
AU - Yoshida, Y.
AU - Furui, H.
AU - Sonehara, M.
AU - Nakamura, K.
AU - Takahashi, W.
AU - Takeuchi, T.
AU - Yajima, S.
AU - Yamazaki, H.
AU - Hasegawa, M.
AU - Nagashima, Y.
AU - Tojo, H.
PY - 2015/12/18
Y1 - 2015/12/18
N2 - Thomson scattering (TS) diagnostics have been widely used in fusion studies to measure profiles of electron temperature Te and electron density ne. In order to measure the low-density plasmas (ne ≤ 1018 m-3) in TST-2, which is sustained by lower hybrid wave power, the signal-to-noise ratio in TS measurement has been improved by various means. For instance, optimization of the detecting system, accumulation of TS data obtained from reproducible discharges, and application of a coaxial multi-pass scheme were carried out. As a result, the profiles have been measured successfully and a peaked ne profile and a hollow Te profile were obtained. Additionally, isotropy of Te near the plasma center was confirmed by coaxial double-pass TS measurement.
AB - Thomson scattering (TS) diagnostics have been widely used in fusion studies to measure profiles of electron temperature Te and electron density ne. In order to measure the low-density plasmas (ne ≤ 1018 m-3) in TST-2, which is sustained by lower hybrid wave power, the signal-to-noise ratio in TS measurement has been improved by various means. For instance, optimization of the detecting system, accumulation of TS data obtained from reproducible discharges, and application of a coaxial multi-pass scheme were carried out. As a result, the profiles have been measured successfully and a peaked ne profile and a hollow Te profile were obtained. Additionally, isotropy of Te near the plasma center was confirmed by coaxial double-pass TS measurement.
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U2 - 10.1088/1748-0221/10/12/C12020
DO - 10.1088/1748-0221/10/12/C12020
M3 - Article
AN - SCOPUS:84958225570
SN - 1748-0221
VL - 10
JO - Journal of Instrumentation
JF - Journal of Instrumentation
IS - 12
M1 - C12020
ER -