Three-dimensional observation of microstructures in Y123 films fabricated by TFA-MOD method

K. Yamada, M. Mitsuhara, S. Hata, Y. Miyanaga, R. Teranishi, N. Mori, M. Mukaida, K. Kaneko

Research output: Contribution to journalArticle

Abstract

We were successful for three-dimensional imaging of microstructures in YBa2Cu3O7-y (Y123) films fabricated by metal organic deposition using trifluoroacetates (TFA-MOD) method. We have reported previously, that a transmission electron microscopy (TEM) analysis clarified microstructures such as Y123 crystal grains and pores in the Y123 films. In order to derive important parameters for enhancement of superconducting properties of the Y123 films, quantitative analyses of those microstructures are required. Then, control of both pores and a-axis oriented grains distribution in the Y123 films are important. However, general TEM images provide only a two-dimensional projection of a three-dimensional object. An electron tomography is an effective technique for three-dimensional structure analysis of various materials. Cross-sectional view specimen for the three-dimensional electron tomography was prepared by focused ion-beam milling equipped with micro-sampling system. A scanning transmission electron microscopy - annular dark field technique was used for the present three-dimensional electron tomography. For the cross-sectional specimen of fired Y123 films, three-dimensional shapes and distributions of both pores and unreacted phases were observed in reconstructed images. Also, morphologies of the Y123 film surface were clearly seen.

Original languageEnglish
Pages (from-to)1446-1449
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume469
Issue number15-20
DOIs
Publication statusPublished - Oct 15 2009

Fingerprint

microstructure
Microstructure
Tomography
tomography
Transmission electron microscopy
porosity
transmission electron microscopy
Electrons
Trifluoroacetic Acid
electrons
Focused ion beams
projection
Metals
ion beams
sampling
Sampling
Imaging techniques
Crystals
Scanning electron microscopy
scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Three-dimensional observation of microstructures in Y123 films fabricated by TFA-MOD method. / Yamada, K.; Mitsuhara, M.; Hata, S.; Miyanaga, Y.; Teranishi, R.; Mori, N.; Mukaida, M.; Kaneko, K.

In: Physica C: Superconductivity and its applications, Vol. 469, No. 15-20, 15.10.2009, p. 1446-1449.

Research output: Contribution to journalArticle

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