Tickness measurement by electron holography

Daisuke Shindo, Yasukazu Murakami

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)134-139
Number of pages6
JournalToraibarojisuto/Journal of Japanese Society of Tribologists
Volume50
Issue number2
Publication statusPublished - May 26 2005
Externally publishedYes

Fingerprint

Electron holography
Holograms
holography
Transmission electron microscopy
Thin films
transmission electron microscopy
thin films
electrons

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Tickness measurement by electron holography. / Shindo, Daisuke; Murakami, Yasukazu.

In: Toraibarojisuto/Journal of Japanese Society of Tribologists, Vol. 50, No. 2, 26.05.2005, p. 134-139.

Research output: Contribution to journalArticle

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