Tight-binding analysis of surface electronic conduction measured with micro-multipoint scanning tunneling microscopy probes

Yoji Suzuki, Masashi Noda, Tomofumi Tada, Satoshi Watanabe

Research output: Contribution to journalArticle

Abstract

To analyze electronic conduction through surface states in micro-multipoint measurements using scanning tunneling microscopy, we calculated electron density and current distribution in a surface with Tamm states of a simple cubic lattice using a tight-binding method with the Hückel approximation. Both wave function and Green's function methods were employed in the calculations, and two peaks of the transmission spectrum were obtained at -1.10 and 2.91 eV using both methods. The analysis of current distribution revealed that the transmission at 2.91 eV mainly corresponds to surface state conduction, whereas that at 2.91 eV includes bulk state conduction. These results suggest that whether or not a measured conductance corresponds to pure surface state conduction is dependent on the energy of injected electrons.

Original languageEnglish
Pages (from-to)2136-2139
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number3 B
DOIs
Publication statusPublished - Mar 27 2006
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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