Time-correlated single photon counting and optical measurement systems for studying single fluorescent emitters under high vacuum conditions

Toshiki Yamada, Kenichi Goushi, Xingsheng Xu, Akira Otomo

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

In this paper, we introduce a modified inverted microscope system in which an objective with high NA (0.95) is located under high-vacuum conditions, and a time-correlated single photon counting system is used along with a modified photomultiplier tube for the characterization of single emitters under high-vacuum conditions. The modified inverted microscope system is designed to be simple, compact, and easy to handle. As an example, the optical properties of individual colloidal semiconductor nanocrystals (CdSe/ZnS) were studied by using these systems.

Original languageEnglish
Pages (from-to)1507-1511
Number of pages5
JournalThin Solid Films
Volume517
Issue number4
DOIs
Publication statusPublished - Dec 31 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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