Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials: Correlation with the recording speed of digital versatile disc media

Yoshimitsu Fukuyama, Nobuhiro Yasuda, Jungeun Kim, Haruno Murayama, Yoshihito Tanaka, Shigeru Kimura, Kenichi Kato, Shinji Kohara, Yutaka Moritomo, Toshiyuki Matsunaga, Rie Kojima, Noboru Yamada, Hitoshi Tanaka, Takashi Ohshima, Masaki Takata

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

The crystallization process in digital versatile disc (DVD) media was investigated using a time-resolved X-ray diffraction apparatus coupled with in situ photoreflectivity measurement. The time profiles of crystallization were found to be consistent with the changes in photoreflectivity. The phase changes were characterized by the start and end time; 90 ±1 and 273 ± 1 ns for Ge2Sb2Te5, and 85 ± 1 and 206 ± 1 ns for Ag3.5In3.5Sb75.0Te 17.7, respectively. The faster crystallization time in Ag 3.5In3.8Sb75.0Te17.7 is ascribed to its characteristic crystallization process; its X-ray diffraction profile shows a significant sharpening during the crystallization process, whereas the peak width of Ge2Sb2Te5 remained unchanged. The present findings suggest that crystal growth control is another key for designing faster phasechange materials.

Original languageEnglish
Pages (from-to)450011-450013
Number of pages3
JournalApplied Physics Express
Volume1
Issue number4
DOIs
Publication statusPublished - Apr 1 2008
Externally publishedYes

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phase change materials
Phase change materials
Crystal growth
crystal growth
Crystallization
recording
crystallization
X ray diffraction
profiles
in situ measurement
diffraction
x rays

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials : Correlation with the recording speed of digital versatile disc media. / Fukuyama, Yoshimitsu; Yasuda, Nobuhiro; Kim, Jungeun; Murayama, Haruno; Tanaka, Yoshihito; Kimura, Shigeru; Kato, Kenichi; Kohara, Shinji; Moritomo, Yutaka; Matsunaga, Toshiyuki; Kojima, Rie; Yamada, Noboru; Tanaka, Hitoshi; Ohshima, Takashi; Takata, Masaki.

In: Applied Physics Express, Vol. 1, No. 4, 01.04.2008, p. 450011-450013.

Research output: Contribution to journalArticle

Fukuyama, Y, Yasuda, N, Kim, J, Murayama, H, Tanaka, Y, Kimura, S, Kato, K, Kohara, S, Moritomo, Y, Matsunaga, T, Kojima, R, Yamada, N, Tanaka, H, Ohshima, T & Takata, M 2008, 'Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials: Correlation with the recording speed of digital versatile disc media', Applied Physics Express, vol. 1, no. 4, pp. 450011-450013. https://doi.org/10.1143/APEX.1.045001
Fukuyama, Yoshimitsu ; Yasuda, Nobuhiro ; Kim, Jungeun ; Murayama, Haruno ; Tanaka, Yoshihito ; Kimura, Shigeru ; Kato, Kenichi ; Kohara, Shinji ; Moritomo, Yutaka ; Matsunaga, Toshiyuki ; Kojima, Rie ; Yamada, Noboru ; Tanaka, Hitoshi ; Ohshima, Takashi ; Takata, Masaki. / Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials : Correlation with the recording speed of digital versatile disc media. In: Applied Physics Express. 2008 ; Vol. 1, No. 4. pp. 450011-450013.
@article{bc5fdc3f83ce469e81eb2a7369ca62ce,
title = "Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials: Correlation with the recording speed of digital versatile disc media",
abstract = "The crystallization process in digital versatile disc (DVD) media was investigated using a time-resolved X-ray diffraction apparatus coupled with in situ photoreflectivity measurement. The time profiles of crystallization were found to be consistent with the changes in photoreflectivity. The phase changes were characterized by the start and end time; 90 ±1 and 273 ± 1 ns for Ge2Sb2Te5, and 85 ± 1 and 206 ± 1 ns for Ag3.5In3.5Sb75.0Te 17.7, respectively. The faster crystallization time in Ag 3.5In3.8Sb75.0Te17.7 is ascribed to its characteristic crystallization process; its X-ray diffraction profile shows a significant sharpening during the crystallization process, whereas the peak width of Ge2Sb2Te5 remained unchanged. The present findings suggest that crystal growth control is another key for designing faster phasechange materials.",
author = "Yoshimitsu Fukuyama and Nobuhiro Yasuda and Jungeun Kim and Haruno Murayama and Yoshihito Tanaka and Shigeru Kimura and Kenichi Kato and Shinji Kohara and Yutaka Moritomo and Toshiyuki Matsunaga and Rie Kojima and Noboru Yamada and Hitoshi Tanaka and Takashi Ohshima and Masaki Takata",
year = "2008",
month = "4",
day = "1",
doi = "10.1143/APEX.1.045001",
language = "English",
volume = "1",
pages = "450011--450013",
journal = "Applied Physics Express",
issn = "1882-0778",
publisher = "Japan Society of Applied Physics",
number = "4",

}

TY - JOUR

T1 - Time-resolved investigation of nanosecond crystal growth in rapid-phase-change materials

T2 - Correlation with the recording speed of digital versatile disc media

AU - Fukuyama, Yoshimitsu

AU - Yasuda, Nobuhiro

AU - Kim, Jungeun

AU - Murayama, Haruno

AU - Tanaka, Yoshihito

AU - Kimura, Shigeru

AU - Kato, Kenichi

AU - Kohara, Shinji

AU - Moritomo, Yutaka

AU - Matsunaga, Toshiyuki

AU - Kojima, Rie

AU - Yamada, Noboru

AU - Tanaka, Hitoshi

AU - Ohshima, Takashi

AU - Takata, Masaki

PY - 2008/4/1

Y1 - 2008/4/1

N2 - The crystallization process in digital versatile disc (DVD) media was investigated using a time-resolved X-ray diffraction apparatus coupled with in situ photoreflectivity measurement. The time profiles of crystallization were found to be consistent with the changes in photoreflectivity. The phase changes were characterized by the start and end time; 90 ±1 and 273 ± 1 ns for Ge2Sb2Te5, and 85 ± 1 and 206 ± 1 ns for Ag3.5In3.5Sb75.0Te 17.7, respectively. The faster crystallization time in Ag 3.5In3.8Sb75.0Te17.7 is ascribed to its characteristic crystallization process; its X-ray diffraction profile shows a significant sharpening during the crystallization process, whereas the peak width of Ge2Sb2Te5 remained unchanged. The present findings suggest that crystal growth control is another key for designing faster phasechange materials.

AB - The crystallization process in digital versatile disc (DVD) media was investigated using a time-resolved X-ray diffraction apparatus coupled with in situ photoreflectivity measurement. The time profiles of crystallization were found to be consistent with the changes in photoreflectivity. The phase changes were characterized by the start and end time; 90 ±1 and 273 ± 1 ns for Ge2Sb2Te5, and 85 ± 1 and 206 ± 1 ns for Ag3.5In3.5Sb75.0Te 17.7, respectively. The faster crystallization time in Ag 3.5In3.8Sb75.0Te17.7 is ascribed to its characteristic crystallization process; its X-ray diffraction profile shows a significant sharpening during the crystallization process, whereas the peak width of Ge2Sb2Te5 remained unchanged. The present findings suggest that crystal growth control is another key for designing faster phasechange materials.

UR - http://www.scopus.com/inward/record.url?scp=57049143768&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=57049143768&partnerID=8YFLogxK

U2 - 10.1143/APEX.1.045001

DO - 10.1143/APEX.1.045001

M3 - Article

AN - SCOPUS:57049143768

VL - 1

SP - 450011

EP - 450013

JO - Applied Physics Express

JF - Applied Physics Express

SN - 1882-0778

IS - 4

ER -