Time-resolved two-dimensional X-ray diffraction measurements of kinetic properties in polycrystalline high-pressure ices

T. Kubo, T. Kondo, A. Shimojuku, T. Kuwabara, T. Kato, T. Kikegawa, N. Hirao, Y. Ohishi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Time-resolved two-dimensional X-ray diffraction method has been applied to observe kinetic properties of polycrystalline high-pressure ices in diamond anvil cell. The relationships between the number of diffraction spots and the number of grains per radiated volume were calibrated at several beamlines of SPring-8 and Photon Factory. Based on the relationships, we examined kinetics of grain growth in ice VI and VII, and kinetics of the ice VI-VII and VI-VIII transformations, from the evolution of the number of diffraction spots. Preliminary results on these kinetic experiments are presented in this paper.

Original languageEnglish
Article number012022
JournalJournal of Physics: Conference Series
Volume215
DOIs
Publication statusPublished - May 11 2010

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pressure ice
kinetics
diffraction
ice
x rays
anvils
industrial plants
diamonds
photons
cells

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Time-resolved two-dimensional X-ray diffraction measurements of kinetic properties in polycrystalline high-pressure ices. / Kubo, T.; Kondo, T.; Shimojuku, A.; Kuwabara, T.; Kato, T.; Kikegawa, T.; Hirao, N.; Ohishi, Y.

In: Journal of Physics: Conference Series, Vol. 215, 012022, 11.05.2010.

Research output: Contribution to journalArticle

Kubo, T. ; Kondo, T. ; Shimojuku, A. ; Kuwabara, T. ; Kato, T. ; Kikegawa, T. ; Hirao, N. ; Ohishi, Y. / Time-resolved two-dimensional X-ray diffraction measurements of kinetic properties in polycrystalline high-pressure ices. In: Journal of Physics: Conference Series. 2010 ; Vol. 215.
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