ToF-SIMS analysis of carbonaceous particles in the sample catcher of the Hayabusa spacecraft Planetary science

Hiroshi Naraoka, Dan Aoki, Kazuhiko Fukushima, Masayuki Uesugi, Motoo Ito, Fumio Kitajima, Hajime Mita, Hikaru Yabuta, Yoshinori Takano, Toru Yada, Yukihiro Ishibashi, Yuzuru Karouji, Takaaki Okada, Masanao Abe

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Three carbonaceous category 3 particles (RA-QD02-0180, RB-QD04-0037-01, and RB-QD04-0047-02) returned in the sample catcher from the Hayabusa spacecraft were analyzed by time of flight-secondary ion mass spectrometry (ToF-SIMS) to establish an analytical procedure for determination of their origins. By the different analytical schemes, the three particles gave distinct elemental and molecular ions, in which the organic carbons commonly appear to be associated with nitrogen, silicon, and/or fluorine. The particles could be debris of silicon rubber and fluorinated compounds and are therefore man-made artifacts rather than natural organic matter.

Original languageEnglish
Article number67
Journalearth, planets and space
Volume67
Issue number1
DOIs
Publication statusPublished - Dec 27 2015

All Science Journal Classification (ASJC) codes

  • Geology
  • Space and Planetary Science

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