Transition-time-relation based capture-safety checking for at-speed scan test generation

K. Miyase, X. Wen, M. Aso, H. Furukawa, Y. Yamato, S. Kajihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation-based) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Pages895-898
Number of pages4
Publication statusPublished - 2011
Event14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 - Grenoble, France
Duration: Mar 14 2011Mar 18 2011

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
CountryFrance
CityGrenoble
Period3/14/113/18/11

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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