Transmission electron microscopy of bulk specimens over 10μm in thickness

Sunao Sadamatsu, Masaki Tanaka, Kenji Higashida, Syo Matsumura

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We succeeded the observation of microstructures in bulk-sized specimens of over 10. μm in thickness by employing a technique that combines transmission electron microscopy (TEM) with energy-filtered imaging based on electron energy-loss spectroscopy (EELS). This method is unique in that it incorporates the inelastically scattered electrons into the imaging process. Using this technique, bright and sharp images of dislocations in crystalline silicon specimens as thick as 10. μm were obtained. A calibration curve to determine foil thickness of such a thick specimen was also derived. This method simply extends the observable thickness range in TEM. If combined with tilt series of observation over a significant range of angle, it will disclose three dimensional nanostructures in a μm-order block of a specimen, promoting our understanding of the controlling mechanisms behind various bulky material properties.

Original languageEnglish
Pages (from-to)10-16
Number of pages7
JournalUltramicroscopy
Volume162
DOIs
Publication statusPublished - Mar 1 2016

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Transmission electron microscopy
Imaging techniques
transmission electron microscopy
Electron energy loss spectroscopy
Silicon
Dislocations (crystals)
Metal foil
Nanostructures
Materials properties
Calibration
Crystalline materials
Microstructure
Electrons
foils
energy dissipation
electron energy
microstructure
silicon
curves
spectroscopy

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Transmission electron microscopy of bulk specimens over 10μm in thickness. / Sadamatsu, Sunao; Tanaka, Masaki; Higashida, Kenji; Matsumura, Syo.

In: Ultramicroscopy, Vol. 162, 01.03.2016, p. 10-16.

Research output: Contribution to journalArticle

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