Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process

K. Yamada; N. Mori; K. Tada; T. Tanaka; R. Teranishi; M. Mukaida; S. Toh; K. Kaneko; T. Izumi; Y. Shiohara

doi:10.1016/j.physc.2007.04.289

Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process

K. Yamada, N. Mori, K. Tada, T. Tanaka, R. Teranishi, M. Mukaida, S. Toh, K. Kaneko, T. Izumi, Y. Shiohara

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa₂Cu₃O_7-δ (Y123) films with high J_C, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO₂ layered LaAlO₃ (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF₂, CuO and Y₂Cu₂O₅ grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.

Original language	English
Pages (from-to)	717-721
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	463-465
Issue number	SUPPL.
DOIs	https://doi.org/10.1016/j.physc.2007.04.289
Publication status	Published - Oct 1 2007

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process. / Yamada, K.; Mori, N.; Tada, K.; Tanaka, T.; Teranishi, R.; Mukaida, M.; Toh, S.; Kaneko, K.; Izumi, T.; Shiohara, Y.

In: Physica C: Superconductivity and its applications, Vol. 463-465, No. SUPPL., 01.10.2007, p. 717-721.

Research output: Contribution to journal › Article › peer-review

@article{d39e11d1bede4342b5e7bb1c69269c2f,

title = "Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process",

abstract = "The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa2Cu3O7-δ (Y123) films with high JC, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO2 layered LaAlO3 (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF2, CuO and Y2Cu2O5 grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.",

author = "K. Yamada and N. Mori and K. Tada and T. Tanaka and R. Teranishi and M. Mukaida and S. Toh and K. Kaneko and T. Izumi and Y. Shiohara",

year = "2007",

month = oct,

day = "1",

doi = "10.1016/j.physc.2007.04.289",

language = "English",

volume = "463-465",

pages = "717--721",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "SUPPL.",

}

TY - JOUR

T1 - Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process

AU - Yamada, K.

AU - Mori, N.

AU - Tada, K.

AU - Tanaka, T.

AU - Teranishi, R.

AU - Mukaida, M.

AU - Toh, S.

AU - Kaneko, K.

AU - Izumi, T.

AU - Shiohara, Y.

PY - 2007/10/1

Y1 - 2007/10/1

N2 - The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa2Cu3O7-δ (Y123) films with high JC, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO2 layered LaAlO3 (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF2, CuO and Y2Cu2O5 grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.

AB - The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa2Cu3O7-δ (Y123) films with high JC, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO2 layered LaAlO3 (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF2, CuO and Y2Cu2O5 grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.

UR - http://www.scopus.com/inward/record.url?scp=34548415490&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34548415490&partnerID=8YFLogxK

U2 - 10.1016/j.physc.2007.04.289

DO - 10.1016/j.physc.2007.04.289

M3 - Article

AN - SCOPUS:34548415490

VL - 463-465

SP - 717

EP - 721

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

IS - SUPPL.

ER -