Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX)

Yuji Soejima, N. Tomonaga, H. Onitsuka, A. Okazaki

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Two slits have been introduced into high-angle double-crystal X ray diffractometry (HADOX): one for limiting the area of the specimen surface to be examined, and the other for defining the resolution of 2θ. This enables us to combine co and 2θ scannings, and to obtain two-dimensional intensity distribution in high resolution on a reciprocal lattice plane parallel to the plane of the diffractometer. By this method, we can determine the temperature dependence of the lattice constant of the specimen crystal without being disturbed by an influence of surroundings, for expample, a distortion of a specimen holder. Moreover, measurements of the lattice constant can be made on a crystal that consists of grains. Applications are made for BaTi03 crystals in connection with the characterization and with the study of the structural phase transition.

Original languageEnglish
Pages (from-to)161-168
Number of pages8
JournalZeitschrift fur Kristallographie - New Crystal Structures
Volume195
Issue number3-4
DOIs
Publication statusPublished - Jan 1 1991

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X ray diffraction analysis
Crystals
Lattice constants
crystals
x rays
Diffractometers
holders
diffractometers
slits
Phase transitions
Scanning
temperature dependence
scanning
high resolution
Temperature

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Inorganic Chemistry

Cite this

Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX). / Soejima, Yuji; Tomonaga, N.; Onitsuka, H.; Okazaki, A.

In: Zeitschrift fur Kristallographie - New Crystal Structures, Vol. 195, No. 3-4, 01.01.1991, p. 161-168.

Research output: Contribution to journalArticle

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