Abstract
Two slits have been introduced into high-angle double-crystal X ray diffractometry (HADOX): one for limiting the area of the specimen surface to be examined, and the other for defining the resolution of 2θ. This enables us to combine co and 2θ scannings, and to obtain two-dimensional intensity distribution in high resolution on a reciprocal lattice plane parallel to the plane of the diffractometer. By this method, we can determine the temperature dependence of the lattice constant of the specimen crystal without being disturbed by an influence of surroundings, for expample, a distortion of a specimen holder. Moreover, measurements of the lattice constant can be made on a crystal that consists of grains. Applications are made for BaTi03 crystals in connection with the characterization and with the study of the structural phase transition.
| Original language | English |
|---|---|
| Pages (from-to) | 161-168 |
| Number of pages | 8 |
| Journal | Zeitschrift fur Kristallographie - New Crystal Structures |
| Volume | 195 |
| Issue number | 3-4 |
| DOIs | |
| Publication status | Published - Jan 1 1991 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Inorganic Chemistry
Cite this
Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX). / Soejima, Yuji; Tomonaga, N.; Onitsuka, H.; Okazaki, A.
In: Zeitschrift fur Kristallographie - New Crystal Structures, Vol. 195, No. 3-4, 01.01.1991, p. 161-168.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX)
AU - Soejima, Yuji
AU - Tomonaga, N.
AU - Onitsuka, H.
AU - Okazaki, A.
PY - 1991/1/1
Y1 - 1991/1/1
N2 - Two slits have been introduced into high-angle double-crystal X ray diffractometry (HADOX): one for limiting the area of the specimen surface to be examined, and the other for defining the resolution of 2θ. This enables us to combine co and 2θ scannings, and to obtain two-dimensional intensity distribution in high resolution on a reciprocal lattice plane parallel to the plane of the diffractometer. By this method, we can determine the temperature dependence of the lattice constant of the specimen crystal without being disturbed by an influence of surroundings, for expample, a distortion of a specimen holder. Moreover, measurements of the lattice constant can be made on a crystal that consists of grains. Applications are made for BaTi03 crystals in connection with the characterization and with the study of the structural phase transition.
AB - Two slits have been introduced into high-angle double-crystal X ray diffractometry (HADOX): one for limiting the area of the specimen surface to be examined, and the other for defining the resolution of 2θ. This enables us to combine co and 2θ scannings, and to obtain two-dimensional intensity distribution in high resolution on a reciprocal lattice plane parallel to the plane of the diffractometer. By this method, we can determine the temperature dependence of the lattice constant of the specimen crystal without being disturbed by an influence of surroundings, for expample, a distortion of a specimen holder. Moreover, measurements of the lattice constant can be made on a crystal that consists of grains. Applications are made for BaTi03 crystals in connection with the characterization and with the study of the structural phase transition.
UR - http://www.scopus.com/inward/record.url?scp=0002696253&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0002696253&partnerID=8YFLogxK
U2 - 10.1524/zkri.1991.195.3-4.161
DO - 10.1524/zkri.1991.195.3-4.161
M3 - Article
AN - SCOPUS:0002696253
VL - 195
SP - 161
EP - 168
JO - Zeitschrift fur Kristallographie - New Crystal Structures
JF - Zeitschrift fur Kristallographie - New Crystal Structures
SN - 1433-7266
IS - 3-4
ER -