TY - JOUR
T1 - Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy
AU - Tyutyunnikov, Dmitry
AU - Mitsuhara, Masatoshi
AU - Koch, Christoph T.
N1 - Funding Information:
The authors acknowledge financial support by the Carl Zeiss Foundation as well as the German Research Foundation (DFG , Grant no. KO 2911/7-1 ). The authors also acknowledge the Stuttgart Center for Electron Microscopy (StEM) headed by Prof. Peter van Aken for the opportunity to carry out the experiment. The authors also acknowledge Kersten Hahn for assistance during the microscope sessions and for measuring the rotation of diffraction plane with respect to the specimen.
Publisher Copyright:
© 2015 Elsevier B.V.
PY - 2015/12/1
Y1 - 2015/12/1
N2 - In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means of transmission electron microscopy. We show that local orientation values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine the orientation of the tilt axis with respect to the image or diffraction pattern. The method has been implemented to automatically acquire the necessary data and then map crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a Ni-based super-alloy CMSX-4. The functionality and limitations of our method are discussed and compared to those of other techniques available.
AB - In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means of transmission electron microscopy. We show that local orientation values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine the orientation of the tilt axis with respect to the image or diffraction pattern. The method has been implemented to automatically acquire the necessary data and then map crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a Ni-based super-alloy CMSX-4. The functionality and limitations of our method are discussed and compared to those of other techniques available.
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U2 - 10.1016/j.ultramic.2015.07.003
DO - 10.1016/j.ultramic.2015.07.003
M3 - Article
AN - SCOPUS:84938699609
SN - 0304-3991
VL - 159
SP - 26
EP - 33
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - P1
ER -