Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy

Dmitry Tyutyunnikov, Masatoshi Mitsuhara, Christoph T. Koch

Research output: Contribution to journalArticle

Abstract

In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means of transmission electron microscopy. We show that local orientation values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine the orientation of the tilt axis with respect to the image or diffraction pattern. The method has been implemented to automatically acquire the necessary data and then map crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a Ni-based super-alloy CMSX-4. The functionality and limitations of our method are discussed and compared to those of other techniques available.

Original languageEnglish
Pages (from-to)26-33
Number of pages8
JournalUltramicroscopy
Volume159
Issue numberP1
DOIs
Publication statusPublished - Dec 1 2015

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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