Ultra Trace Determination Scheme for 26 Al by High-Resolution Resonance Ionization Mass Spectrometry using a Pulsed Ti:Sapphire Laser

Hideki Tomita, Christoph Mattolat, Thomas Kessler, Sebastian Raeder, Fabio Schwellnus, Klaus D.A. Wendt, Kenichi Watanabe, Tetsuo Iguichi

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

We propose an ultra trace analysis approach for 26Al by high-resolution Resonance Ionization Mass Spectrometry (RIMS) using a pulsed narrow band-width Ti:Sapphire laser. For ensuring efficient ionization and high isotopic selectivity in RIMS of Al, we developed an injection seeded pulsed Ti:Sapphire laser with high repetition rate operation at up to 10 kHz. The laser produced an output power of 2 W and a spectral band-width of ≈20 MHz with a repetition rate of 7 kHz. A first demonstration of its performance was done by detecting stable 27Al using RIMS.

Original languageEnglish
Pages (from-to)37-42
Number of pages6
Journaljournal of nuclear science and technology
Volume45
DOIs
Publication statusPublished - Sep 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering

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