A novel ultrafast optical signal measurement technique is proposed that uses a fast photodetector and electrooptic (EO) sampling. The technique can satisfy three requirements for the measurement: large bandwidth, high sensitivity, and polarization independence. The measurement systems are demonstrated using two kinds of EO sampling configurations. One system uses direct EO sampling. It affords a larger bandwidth. The system can discern 100-Gbit s-1 return-to-zero (RZ) optical pulse-pattern signals with an on-off ratio of 22 dB. The other system uses a waveguide intensity modulator in EO sampling. It affords higher sesitivity and can measure an 80-Gbit s-1 RZ optical eye diagram. It is theoretically expected that the sensitivity of our system is higher than that of the all-optical technique.
|Number of pages||15|
|Journal||Optical and Quantum Electronics|
|Publication status||Published - Dec 1 1998|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering