Understanding Structural Variability Induced by Pr segregation in SrTiO3 Grain Boundaries

H. Yang, Yukio Sato, H. S. Lee, Y. Ikuhara, N. D. Browning

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)426-427
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
Publication statusPublished - Jan 1 2012
Externally publishedYes

Fingerprint

Grain boundaries
grain boundaries

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Understanding Structural Variability Induced by Pr segregation in SrTiO3 Grain Boundaries. / Yang, H.; Sato, Yukio; Lee, H. S.; Ikuhara, Y.; Browning, N. D.

In: Microscopy and Microanalysis, Vol. 18, 01.01.2012, p. 426-427.

Research output: Contribution to journalArticle

Yang, H. ; Sato, Yukio ; Lee, H. S. ; Ikuhara, Y. ; Browning, N. D. / Understanding Structural Variability Induced by Pr segregation in SrTiO3 Grain Boundaries. In: Microscopy and Microanalysis. 2012 ; Vol. 18. pp. 426-427.
@article{c8cd464a6401452590cbed5fc8840cf0,
title = "Understanding Structural Variability Induced by Pr segregation in SrTiO3 Grain Boundaries",
author = "H. Yang and Yukio Sato and Lee, {H. S.} and Y. Ikuhara and Browning, {N. D.}",
year = "2012",
month = "1",
day = "1",
doi = "10.1017/S1431927612003984",
language = "English",
volume = "18",
pages = "426--427",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Understanding Structural Variability Induced by Pr segregation in SrTiO3 Grain Boundaries

AU - Yang, H.

AU - Sato, Yukio

AU - Lee, H. S.

AU - Ikuhara, Y.

AU - Browning, N. D.

PY - 2012/1/1

Y1 - 2012/1/1

UR - http://www.scopus.com/inward/record.url?scp=85007984704&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85007984704&partnerID=8YFLogxK

U2 - 10.1017/S1431927612003984

DO - 10.1017/S1431927612003984

M3 - Article

AN - SCOPUS:85007984704

VL - 18

SP - 426

EP - 427

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

ER -