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Dive into the research topics of 'Verification of the injection enhancement effect in IGBTs by measuring the electron and hole currents separately'. Together they form a unique fingerprint.- Sort by
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T. Hoshii, K. Furukawa, K. Kakushima, M. Watanabe, N. Shigvo, T. Saraya, T. Takakura, K. Ltou, M. Fukui, S. Suzuki, K. Takeuchi, I. Muneta, H. Wakabayashi, S. Nishizawa, K. Tsutsui, T. Hiramoto, H. Ohashi, H. Lwai
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution