VirtualScan: A new compressed scan technology for test cost reduction

Laung Terng Wang, Xiaoqing Wen, Hiroshi Furukawa, Fei Sheng Hsu, Shyh Horng Lin, Sen Wei Tsai, Khader S. Abdel-Hafez, Shianling Wu

Research output: Contribution to journalConference article

87 Citations (Scopus)

Abstract

This paper describes the VirtualScan technology for scan test cost reduction. Scan chains in a VirtualScan circuit are split into shorter ones and the gap between external scan ports and internal scan chains are bridged with a broadcaster and a compactor. Test patterns for a VirtualScan circuit are generated directly by one-pass VirtualScan ATPG, in which multi-capture clocking and maximum test compaction are supported. In addition, VirtualScan ATPG avoids unknown-value and aliasing effects algorithmically without adding any additional circuitry. The VirtualScan technology has achieved successful tape-outs of industrial chips and has been proven to be an efficient and easy-to-implement solution for scan test cost reduction.

Original languageEnglish
Pages (from-to)916-925
Number of pages10
JournalProceedings - International Test Conference
Publication statusPublished - Dec 1 2004
EventProceedings - International Test Conference 2004 - Charlotte, NC, United States
Duration: Oct 26 2004Oct 28 2004

Fingerprint

Cost reduction
Networks (circuits)
Costs
Tapes
Compaction
Aliasing
Chip
Internal
Unknown

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Wang, L. T., Wen, X., Furukawa, H., Hsu, F. S., Lin, S. H., Tsai, S. W., ... Wu, S. (2004). VirtualScan: A new compressed scan technology for test cost reduction. Proceedings - International Test Conference, 916-925.

VirtualScan : A new compressed scan technology for test cost reduction. / Wang, Laung Terng; Wen, Xiaoqing; Furukawa, Hiroshi; Hsu, Fei Sheng; Lin, Shyh Horng; Tsai, Sen Wei; Abdel-Hafez, Khader S.; Wu, Shianling.

In: Proceedings - International Test Conference, 01.12.2004, p. 916-925.

Research output: Contribution to journalConference article

Wang, LT, Wen, X, Furukawa, H, Hsu, FS, Lin, SH, Tsai, SW, Abdel-Hafez, KS & Wu, S 2004, 'VirtualScan: A new compressed scan technology for test cost reduction', Proceedings - International Test Conference, pp. 916-925.
Wang LT, Wen X, Furukawa H, Hsu FS, Lin SH, Tsai SW et al. VirtualScan: A new compressed scan technology for test cost reduction. Proceedings - International Test Conference. 2004 Dec 1;916-925.
Wang, Laung Terng ; Wen, Xiaoqing ; Furukawa, Hiroshi ; Hsu, Fei Sheng ; Lin, Shyh Horng ; Tsai, Sen Wei ; Abdel-Hafez, Khader S. ; Wu, Shianling. / VirtualScan : A new compressed scan technology for test cost reduction. In: Proceedings - International Test Conference. 2004 ; pp. 916-925.
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