Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto, Y. Yamada, T. Matsuki, Ken Onda, T. Noguchi, R. Mizokuchi, S. Oda, S. Koshihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

Original languageEnglish
Title of host publication19th International Conference on Ultrafast Phenomena, UP 2014
PublisherOptical Society of American (OSA)
ISBN (Print)1557522790, 9781557522795
Publication statusPublished - 2014
Externally publishedYes
Event19th International Conference on Ultrafast Phenomena, UP 2014 - Okinawa, Japan
Duration: Jul 7 2014Jul 11 2014

Other

Other19th International Conference on Ultrafast Phenomena, UP 2014
CountryJapan
CityOkinawa
Period7/7/147/11/14

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Fukumoto, K., Yamada, Y., Matsuki, T., Onda, K., Noguchi, T., Mizokuchi, R., ... Koshihara, S. (2014). Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy. In 19th International Conference on Ultrafast Phenomena, UP 2014 Optical Society of American (OSA).