Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto; Y. Yamada; T. Matsuki; Ken Onda; T. Noguchi; R. Mizokuchi; S. Oda; S. Koshihara

Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto, Y. Yamada, T. Matsuki, Ken Onda, T. Noguchi, R. Mizokuchi, S. Oda, S. Koshihara

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

Original language	English
Title of host publication	19th International Conference on Ultrafast Phenomena, UP 2014
Publisher	Optical Society of American (OSA)
ISBN (Print)	1557522790, 9781557522795
Publication status	Published - 2014
Externally published	Yes
Event	19th International Conference on Ultrafast Phenomena, UP 2014 - Okinawa, Japan Duration: Jul 7 2014 → Jul 11 2014

Other

Other	19th International Conference on Ultrafast Phenomena, UP 2014
Country/Territory	Japan
City	Okinawa
Period	7/7/14 → 7/11/14

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Fukumoto, K, Yamada, Y, Matsuki, T, Onda, K, Noguchi, T, Mizokuchi, R, Oda, S & Koshihara, S 2014, Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy. in 19th International Conference on Ultrafast Phenomena, UP 2014. Optical Society of American (OSA), 19th International Conference on Ultrafast Phenomena, UP 2014, Okinawa, Japan, 7/7/14.

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title = "Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy",

abstract = "We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.",

author = "K. Fukumoto and Y. Yamada and T. Matsuki and Ken Onda and T. Noguchi and R. Mizokuchi and S. Oda and S. Koshihara",

year = "2014",

language = "English",

isbn = "1557522790",

booktitle = "19th International Conference on Ultrafast Phenomena, UP 2014",

publisher = "Optical Society of American (OSA)",

note = "19th International Conference on Ultrafast Phenomena, UP 2014 ; Conference date: 07-07-2014 Through 11-07-2014",

}

TY - GEN

T1 - Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

AU - Fukumoto, K.

AU - Yamada, Y.

AU - Matsuki, T.

AU - Onda, Ken

AU - Noguchi, T.

AU - Mizokuchi, R.

AU - Oda, S.

AU - Koshihara, S.

PY - 2014

Y1 - 2014

N2 - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

AB - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

UR - http://www.scopus.com/inward/record.url?scp=84906690202&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84906690202&partnerID=8YFLogxK

M3 - Conference contribution

SN - 1557522790

SN - 9781557522795

BT - 19th International Conference on Ultrafast Phenomena, UP 2014

PB - Optical Society of American (OSA)

T2 - 19th International Conference on Ultrafast Phenomena, UP 2014

Y2 - 7 July 2014 through 11 July 2014

ER -

Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

Abstract

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All Science Journal Classification (ASJC) codes

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