Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto, Y. Yamada, T. Matsuki, K. Onda, T. Noguchi, R. Mizokuchi, S. Oda, S. Koshihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

Original languageEnglish
Title of host publicationUltrafast Phenomena XIX - Proceedings of the 19th International Conference
EditorsLouis DiMauro, Regina de Vivie-Riedle, Kaoru Yamanouchi, Makoto Kuwata-Gonokami, Steven Cundiff
PublisherSpringer Science and Business Media, LLC
Pages337-340
Number of pages4
ISBN (Electronic)9783319132419
DOIs
Publication statusPublished - 2015
Externally publishedYes
Event19th International Conference on Ultrafast Phenomena, 2014 - Okinawa, Japan
Duration: Jul 7 2014Jul 11 2014

Publication series

NameSpringer Proceedings in Physics
Volume162
ISSN (Print)0930-8989
ISSN (Electronic)1867-4941

Other

Other19th International Conference on Ultrafast Phenomena, 2014
CountryJapan
CityOkinawa
Period7/7/147/11/14

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy'. Together they form a unique fingerprint.

Cite this