Voltage versus flux relation of high tc dc superconducting quantum interference device with different inductances

Keiji Enpuku

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The voltage versus flux (V-$) relation of dc superconducting quantum interference devices (SQUIDs) in the presence of thermal noise at T— 77 K is studied. A theoretical expression for the modulation voltage AVin the V-<P relation is presented as a function of SQUID inductance. The theoretical expression is compared with experimental results of AV reported recently for high Tc SQUIDs with different inductances. It is shown that experimental results agree quantitatively with theoretical ones. It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases. The dependence of the modulation voltage on the inductance clarified in the paper is useful for developing a magnetic sensor using the SQUID.

Original languageEnglish
Pages (from-to)1407-1409
Number of pages3
JournalJapanese Journal of Applied Physics
Volume32
Issue number10 A
DOIs
Publication statusPublished - Jan 1 1993

Fingerprint

SQUIDs
inductance
Inductance
Fluxes
interference
Modulation
Electric potential
electric potential
modulation
Magnetic sensors
Thermal noise
thermal noise
Josephson junctions
Defects
sensors
defects

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Voltage versus flux relation of high tc dc superconducting quantum interference device with different inductances. / Enpuku, Keiji.

In: Japanese Journal of Applied Physics, Vol. 32, No. 10 A, 01.01.1993, p. 1407-1409.

Research output: Contribution to journalArticle

@article{d9f21c8f814449bdb7373b6dd803b73f,
title = "Voltage versus flux relation of high tc dc superconducting quantum interference device with different inductances",
abstract = "The voltage versus flux (V-$) relation of dc superconducting quantum interference devices (SQUIDs) in the presence of thermal noise at T— 77 K is studied. A theoretical expression for the modulation voltage AVin the V-<P relation is presented as a function of SQUID inductance. The theoretical expression is compared with experimental results of AV reported recently for high Tc SQUIDs with different inductances. It is shown that experimental results agree quantitatively with theoretical ones. It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases. The dependence of the modulation voltage on the inductance clarified in the paper is useful for developing a magnetic sensor using the SQUID.",
author = "Keiji Enpuku",
year = "1993",
month = "1",
day = "1",
doi = "10.1143/JJAP.32.L1407",
language = "English",
volume = "32",
pages = "1407--1409",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "10 A",

}

TY - JOUR

T1 - Voltage versus flux relation of high tc dc superconducting quantum interference device with different inductances

AU - Enpuku, Keiji

PY - 1993/1/1

Y1 - 1993/1/1

N2 - The voltage versus flux (V-$) relation of dc superconducting quantum interference devices (SQUIDs) in the presence of thermal noise at T— 77 K is studied. A theoretical expression for the modulation voltage AVin the V-<P relation is presented as a function of SQUID inductance. The theoretical expression is compared with experimental results of AV reported recently for high Tc SQUIDs with different inductances. It is shown that experimental results agree quantitatively with theoretical ones. It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases. The dependence of the modulation voltage on the inductance clarified in the paper is useful for developing a magnetic sensor using the SQUID.

AB - The voltage versus flux (V-$) relation of dc superconducting quantum interference devices (SQUIDs) in the presence of thermal noise at T— 77 K is studied. A theoretical expression for the modulation voltage AVin the V-<P relation is presented as a function of SQUID inductance. The theoretical expression is compared with experimental results of AV reported recently for high Tc SQUIDs with different inductances. It is shown that experimental results agree quantitatively with theoretical ones. It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases. The dependence of the modulation voltage on the inductance clarified in the paper is useful for developing a magnetic sensor using the SQUID.

UR - http://www.scopus.com/inward/record.url?scp=0027678314&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027678314&partnerID=8YFLogxK

U2 - 10.1143/JJAP.32.L1407

DO - 10.1143/JJAP.32.L1407

M3 - Article

AN - SCOPUS:0027678314

VL - 32

SP - 1407

EP - 1409

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 10 A

ER -