Vortex dynamics in superconducting transition edge sensors

S. Ezaki, K. Maehata, N. Iyomoto, T. Asano, B. Shinozaki

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Abstract

The temperature dependence of the electrical resistance (R-T) and the current-voltage (I-V) characteristics has been measured and analyzed in a 40 nm thick Ti thin film, which is used as a transition edge sensor (TES). The analyses of the I-V characteristics with the vortex-antivortex pair dissociation model indicate the possible existence of the Berezinskii-Kosterlitz-Thouless (BKT) transition in two-dimensional superconducting Ti thin films. We investigated the noise due to the vortices' flow in TESs. The values of the current noise spectral density in the TESs were estimated by employing the vortex dynamics caused by the BKT transition in the Ti thin films. The estimated values of the current noise spectral density induced by the vortices' flow were in respectable agreement with the values of excess noise experimentally observed in the TESs with Ti/Au bilayer.

Original languageEnglish
Article number084504
JournalJournal of Applied Physics
Volume123
Issue number8
DOIs
Publication statusPublished - Feb 28 2018

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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