Weakly ionized plasma channel by accumulation effect of charged particles using high repetition rate excimer laser

Michiteru Yamaura, Nobuya Hayashi, Satoshi Ihara, Saburoh Satoh, Y. A.M. Chobei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper describes accumulation effect of charged particles using high repetition rate KrF excimer laser for the laser-triggered lightning technique. The accumulation effect was investigated by the measurement of charged particle density varying the repetition rate of the laser. The process and effect of the accumulation of charged particles were confirmed in the case of laser repetition rate of 1 kHz.

Original languageEnglish
Title of host publicationPPPS 2001 - Pulsed Power Plasma Science 2001
EditorsRobert Reinovsky, Mark Newton
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1312-1315
Number of pages4
ISBN (Electronic)0780371208, 9780780371200
DOIs
Publication statusPublished - 2001
Externally publishedYes
Event28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, United States
Duration: Jun 17 2001Jun 22 2001

Publication series

NamePPPS 2001 - Pulsed Power Plasma Science 2001
Volume2

Other

Other28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
Country/TerritoryUnited States
CityLas Vegas
Period6/17/016/22/01

All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

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