X-ray diffractometry for the structure determination of a submicrometre single powder grain

Nobuhiro Yasuda, Haruno Murayama, Yoshimitsu Fukuyama, Jungeun Kim, Shigeru Kimura, Koshiro Toriumi, Yoshihito Tanaka, Yutaka Moritomo, Yoshihiro Kuroiwa, Kenichi Kato, Hitoshi Tanaka, Masaki Takata

Research output: Contribution to journalArticle

48 Citations (Scopus)

Abstract

A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale single powder grain to be measured. The phase zone plate was designed to create a high-flux focused synchrotron radiation beam. A low-eccentric goniometer and high-precision sample positioning stages were adopted to ensure the alignment of a micrometre-scale focused synchrotron radiation beam onto the submicrometre-scale single powder grain. In order to verify the diffractometer performance, the diffraction pattern data of several powder grains of BaTiO3, of dimensions ̃600 × 600 × 300 nm, were measured. By identifying the diffraction data set of one single powder grain, the crystal structure was successfully determined with a reliable factor of 5.24%.

Original languageEnglish
Pages (from-to)352-357
Number of pages6
JournalJournal of Synchrotron Radiation
Volume16
Issue number3
DOIs
Publication statusPublished - May 18 2009

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X ray diffraction analysis
Diffractometers
Powders
Synchrotron radiation
diffractometers
synchrotron radiation
x rays
Diffraction
Goniometers
goniometers
Wigglers
eccentrics
diffraction
Diffraction patterns
positioning
micrometers
diffraction patterns
Crystal structure
alignment
Fluxes

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

X-ray diffractometry for the structure determination of a submicrometre single powder grain. / Yasuda, Nobuhiro; Murayama, Haruno; Fukuyama, Yoshimitsu; Kim, Jungeun; Kimura, Shigeru; Toriumi, Koshiro; Tanaka, Yoshihito; Moritomo, Yutaka; Kuroiwa, Yoshihiro; Kato, Kenichi; Tanaka, Hitoshi; Takata, Masaki.

In: Journal of Synchrotron Radiation, Vol. 16, No. 3, 18.05.2009, p. 352-357.

Research output: Contribution to journalArticle

Yasuda, N, Murayama, H, Fukuyama, Y, Kim, J, Kimura, S, Toriumi, K, Tanaka, Y, Moritomo, Y, Kuroiwa, Y, Kato, K, Tanaka, H & Takata, M 2009, 'X-ray diffractometry for the structure determination of a submicrometre single powder grain', Journal of Synchrotron Radiation, vol. 16, no. 3, pp. 352-357. https://doi.org/10.1107/S090904950900675X
Yasuda, Nobuhiro ; Murayama, Haruno ; Fukuyama, Yoshimitsu ; Kim, Jungeun ; Kimura, Shigeru ; Toriumi, Koshiro ; Tanaka, Yoshihito ; Moritomo, Yutaka ; Kuroiwa, Yoshihiro ; Kato, Kenichi ; Tanaka, Hitoshi ; Takata, Masaki. / X-ray diffractometry for the structure determination of a submicrometre single powder grain. In: Journal of Synchrotron Radiation. 2009 ; Vol. 16, No. 3. pp. 352-357.
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