X-ray imaging test for a single-stage MEMS X-ray optical system

Ikuyuki Mitsuishi, Yuichiro Ezoe, Kensuke Ishizu, Teppei Moriyama, Yoshitomo Maeda, Takayuki Hayashi, Takuro Sato, Makoto Mita, N. Y. Yamasaki, K. Mitsuda, Mitsuhiro Horade, Susumu Sugiyama, Raul E. Riveros, Taylor Boggs, Hitomi Yamaguchi, Yoshiaki Kanamori, Kohei Morishita, Kazuo Nakajima, Ryutaro Maeda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science