X-ray micro-tomography using white beam radiation from SPring-8

M. Hoshino, K. Uesugi, T. Sera, N. Yagi

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


An X-ray micro-tomography system using white beam radiation was developed. A flat mirror was used to eliminate X-rays with energies higher than the critical energy of the mirror under the total reflection condition. To enlarge the field of view in the reflected beam, a simple mechanical bender was used to expand the beam in the vertical direction. A single tomographic dataset was obtained with the scanning time of 0.5sec using a fast rotational sample stage. The dominant X-ray energy which contributed to the image formation in the tomographic measurement was estimated from the linear absorption coefficient of the standard samples.

Original languageEnglish
Article numberP07018
JournalJournal of Instrumentation
Issue number7
Publication statusPublished - Jul 2013
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Mathematical Physics
  • Instrumentation


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