X-ray micro-tomography using white beam radiation from SPring-8

An X-ray micro-tomography system using white beam radiation was developed. A flat mirror was used to eliminate X-rays with energies higher than the critical energy of the mirror under the total reflection condition. To enlarge the field of view in the reflected beam, a simple mechanical bender was used to expand the beam in the vertical direction. A single tomographic dataset was obtained with the scanning time of 0.5sec using a fast rotational sample stage. The dominant X-ray energy which contributed to the image formation in the tomographic measurement was estimated from the linear absorption coefficient of the standard samples.