X-ray photon correlation spectroscopy of silica particles grafted with polymer brush in polystyrene matrix

Taiki Hoshino, Moriya Kikuchi, Daiki Murakami, Koji Mitamura, Yoshiko Harada, Kiminori Ito, Yoshihito Tanaka, Sono Sasaki, Masaki Takata, Atsushi Takahara

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Abstract

X-ray photon correlation spectroscopy system was setup at SPring-8, BL19LXU, and the partial coherence scattering data from the silica particles grafted with polymer brush in polystyrene matrix were measured. Firstly, the static speckle patterns were checked. Below the glass transition temperature of polystyrene (T g ), speckles were clearly observed, on the other hand, above T g , the scattering patterns became smooth and speckles were hardly observed. These variances of the speckle patterns result from the particle motion. Secondly, from the time variance of the speckle data, time autocorrelation functions g 2 (q,t) are calculated. While the flat behaviour of g 2 (q,t) without relaxation were observed below T g , the relaxation behavior with relaxation time∼10 0 -10 1 were observed above T g

Original languageEnglish
Article number012020
JournalJournal of Physics: Conference Series
Volume272
Issue number1
DOIs
Publication statusPublished - Jan 1 2011

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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