X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

Shigeru Kimura; Yutaka Moritomo; Yoshihito Tanaka; Hitoshi Tanaka; Koshiro Toriumi; Kenichi Kato; Nobuhiro Yasuda; Yoshimitsu Fukuyama; Jungeun Kim; Haruno Murayama; Masaki Takata

doi:10.1063/1.2436288

X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

Shigeru Kimura, Yutaka Moritomo, Yoshihito Tanaka, Hitoshi Tanaka, Koshiro Toriumi, Kenichi Kato, Nobuhiro Yasuda, Yoshimitsu Fukuyama, Jungeun Kim, Haruno Murayama, Masaki Takata

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

15 Citations (Scopus)

Abstract

The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.

Original language	English
Title of host publication	SYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publication	Ninth International Conference on Synchrotron Radiation Instrumentation
Pages	1238-1241
Number of pages	4
DOIs	https://doi.org/10.1063/1.2436288
Publication status	Published - Mar 26 2007
Externally published	Yes
Event	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of Duration: May 28 2006 → Jun 28 2006

Publication series

Name	AIP Conference Proceedings
Volume	879
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country/Territory	Korea, Republic of
City	Daegu
Period	5/28/06 → 6/28/06

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

Access to Document

10.1063/1.2436288

Cite this

Kimura, S., Moritomo, Y., Tanaka, Y., Tanaka, H., Toriumi, K., Kato, K., Yasuda, N., Fukuyama, Y., Kim, J., Murayama, H., & Takata, M. (2007). X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1238-1241). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436288

X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8. / Kimura, Shigeru; Moritomo, Yutaka; Tanaka, Yoshihito et al.
SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. 2007. p. 1238-1241 (AIP Conference Proceedings; Vol. 879).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kimura, S, Moritomo, Y, Tanaka, Y, Tanaka, H, Toriumi, K, Kato, K, Yasuda, N, Fukuyama, Y, Kim, J, Murayama, H & Takata, M 2007, X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8. in SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings, vol. 879, pp. 1238-1241, SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation, Daegu, Korea, Republic of, 5/28/06. https://doi.org/10.1063/1.2436288

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abstract = "The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, {"}x-ray pinpoint structural measurement{"}, which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of {"}x-ray pinpoint structural measurement{"} technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.",

author = "Shigeru Kimura and Yutaka Moritomo and Yoshihito Tanaka and Hitoshi Tanaka and Koshiro Toriumi and Kenichi Kato and Nobuhiro Yasuda and Yoshimitsu Fukuyama and Jungeun Kim and Haruno Murayama and Masaki Takata",

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AU - Kimura, Shigeru

AU - Moritomo, Yutaka

AU - Tanaka, Yoshihito

AU - Tanaka, Hitoshi

AU - Toriumi, Koshiro

AU - Kato, Kenichi

AU - Yasuda, Nobuhiro

AU - Fukuyama, Yoshimitsu

AU - Kim, Jungeun

AU - Murayama, Haruno

AU - Takata, Masaki

PY - 2007/3/26

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N2 - The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.

AB - The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.

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X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

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