X-ray tube voltage dependence of wiener spectra of screen structure mottle recorded on front and back emulsions

Hidetaka Arimura, Takaharu Ikeda, Takeshi Ikari, Nobuyuki Nakamori, Hitoshi Kanamori, Hideaki Kubota, Masao Matsumoto, Atsushi Takigawa

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A low-speed screen/film system was used to investigate structure mottle, i.e., the density fluctuation of an x-ray film due to inhomogeneous screen structure. The tube voltage dependence of the Wiener spectra of the structure mottle was separately determined for front and back film emulsions. The Wiener spectral values of the structure mottle of the front emulsion were greater than those of the back emulsion at lower tube voltages. The spectral values of the structure mottle of the front emulsion decreased with tube voltage, while those of the back emulsion increased. We explain these phenomena by the behavior of the Wiener spectra of the relative spatial fluctuation of fluorescence intensity due to following reasons: (1) spatial thickness fluctuation of the screen produces a relative spatial fluctuation of x-ray energy absorbed in the screen, and (2) as the distance between the emulsion of the film and the average position of the x-ray absorption in the screen lengthens, the number of random scattering and absorption of light photons increase.

Original languageEnglish
Pages (from-to)154-158
Number of pages5
JournalOptical Review
Volume2
Issue number2
DOIs
Publication statusPublished - 1995
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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