Fingerprint Energy Engineering Sciencesが取り組む研究トピックをご確認ください。これらのトピックラベルは、この組織のメンバーの研究に基づいています。これらを共に使用することで、固有の認識が可能になります。

Engineering & Materials Science

Fabrication
Annealing
Substrates
Passivation
Defects
Physical vapor deposition
Metals
Photoluminescence
Electron cyclotron resonance
Deep level transient spectroscopy
Oxides
Plasmas
Coatings
Gate dielectrics
MOSFET devices
Interface states
Thermal conductivity
Electric properties
Oxidation
Condensation
Temperature
Hole mobility
Microstructure
Membranes
Leakage currents
Transmission electron microscopy
Zirconia
Strain relaxation
Sputtering
Electron diffraction
Spark plasma sintering
Structural properties
Capacitance
Solar cells
Electrons
Composite materials
Fluorspar
Yttria stabilized zirconia
Personal digital assistants
Porosity
Field effect transistors
Ashes
Germanium
Thermal diffusion
Atoms
Electroluminescence
Diodes
Oxide films
Elastic moduli
Thermal diffusivity
Wet etching
Semiconducting silicon
Electron beams
Capacitors
Lasers
Carrier mobility
Sputter deposition
Hardness
Growth temperature
Contamination
Thermal barrier coatings
Alumina
Finite element method
X ray photoelectron spectroscopy
Energy gap
CMOS integrated circuits
Lutetium
Laser excitation
Raman spectroscopy
Heat treatment
MOS capacitors
Nanoindentation
Krypton
Mechanical properties
Volume fraction
Surface roughness
Hot pressing
Ion implantation
Sintering
Capacitance measurement
Fermi level
Dielectric films
Oxygen
Hole concentration
Aluminosilicates
Growth kinetics
Carbon fiber reinforced plastics
Irradiation
Nitrogen
Permittivity
Current density
Metallizing
Composite structures
Silicon nitride
Plastic flow
Electric sparks
Etching
Electrodes
Hydroxyapatite
Cavitation

Physics & Astronomy

General

insulators
passivity
evaluation
wafers
defects
capacitors
metals
membranes
condensation
microstructure
leakage
transmission electron microscopy
porosity
vapor deposition
oxide films
thin films
thick films
electric contacts
borders
corrosion
composite structures
surface layers
sintering
ultraviolet lasers
conductivity
damage
lasers
energy

Engineering

metal oxide semiconductors
annealing
fabrication
field effect transistors
electrical properties
coatings
hole mobility
interlayers
capacitance
etching
solar cells
sparks
traps
sputtering
transistors
minority carriers
MIS (semiconductors)
contamination
diodes
spectral mixture analysis
space transportation system
p-n junctions
life (durability)
electrodes
conduction bands
irradiation
heterojunctions
magnetron sputtering
graphene
x rays

Physics

photoluminescence
electron cyclotron resonance
thermal conductivity
strain distribution
temperature
excitons
electron diffraction
electroluminescence
oxygen plasma
atoms
low pressure

Chemistry and Materials

oxides
oxidation
zirconium oxides
yttria-stabilized zirconia
composite materials
germanium
crystallization
aluminum oxides
fluorite
carbon fiber reinforced plastics
lutetium
glass
nitrogen
ashes
solid phases
krypton
silicon nitrides
yttrium-aluminum garnet
water vapor
magnesium
calcium
mechanical properties
surface roughness

Aerospace Sciences

spectroscopy
photoelectron spectroscopy
Raman spectroscopy

Aeronautics

trajectory control
cavitation flow

Geosciences

mesas
volcanology

Mathematical and Computer Sciences

finite element method

Chemical Compounds

Oxides
Physical vapor deposition
Annealing
Coatings
Gate dielectrics
Substrates
Thermal conductivity
Metals
Plasmas
Microstructure
Passivation
Fabrication
Photoluminescence
Electric properties
Oxidation
Defects
MOSFET devices
Germanium
Membranes
Spark plasma sintering
Hole mobility
Composite materials
Transmission electron microscopy
Fluorspar
Aluminum Oxide
Strain relaxation
Yttria stabilized zirconia
Temperature
Condensation
Porosity
Electron cyclotron resonance
Personal digital assistants
Electron diffraction
Elastic moduli
Thermal diffusivity
Structural properties
Leakage currents
Electron beams
Deep level transient spectroscopy
Hardness
Thermal barrier coatings
Lutetium
Sputtering
Volcanic Eruptions
Interface states
Lasers
Steam
Graphite
Laser excitation
MOS capacitors
Nanoindentation
Mechanical properties
Volume fraction
Sputter deposition
Surface roughness
Hot pressing
Sintering
Capacitance measurement
Dielectric films
Heat treatment
Energy gap
X ray photoelectron spectroscopy
Raman spectroscopy
Electroluminescence
Durapatite
Field effect transistors
Permittivity
Metallizing
Composite structures
Diodes
Nickel
Plastic flow
Electric sparks
Atoms
Cavitation
Grain boundaries
Magnetron sputtering
Corrosion
Finite element method
Crystalline materials
Oxide films
Capacitors
Heterojunctions
Gases
Capacitance
Solar cells
Current density
Multilayers
Contamination
Nitrogen
Thermodynamic properties
Doping (additives)
Single crystals
Fatigue of materials
Wire
Etching
Growth temperature
Calcium
Fermi level