研究成果 1998 2019

フィルター
Conference article
2006
2 引用 (Scopus)

Electrical characterization of thin SOI wafers using lateral MOS transient capacitance measurements

Wang, D., Ueda, A., Takada, H. & Nakashima, H., 4 1 2006, : : Physica B: Condensed Matter. 376-377, 1, p. 411-415 5 p.

研究成果: ジャーナルへの寄稿Conference article

Capacitance measurement
metal oxide semiconductors
capacitors
Capacitors
capacitance
1 引用 (Scopus)

Fe gettering by p+ layer in bifacial Si solar cell fabrication

Terakawa, T., Wang, D. & Nakashima, H., 4 1 2006, : : Physica B: Condensed Matter. 376-377, 1, p. 231-235 5 p.

研究成果: ジャーナルへの寄稿Conference article

Solar cells
Contamination
solar cells
contamination
Fabrication