10 to 72-Gb/s, optoelectronic RZ pulse-pattern generation and its application to on-wafer large-signal characterization for ultrahigh-speed electronic devices

Taiichi Otsuji, Kazutoshi Kato, Tadao Nagatsuma, Mikio Yoneyama

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

7 被引用数 (Scopus)

抄録

A pulse-rate tunable, fully electrically controllable optoelectronic random pulse generator operating at 10 to 72 Gb/s in return-to-zero (RZ) mode and an on-wafer optical-to-electrical conversion stimulus probe head with 0.6-A/W responsivity, 200-mVpp saturation output, and a near 100-GHz bandwidth is addressed. Its application, in combination with electrooptic sampling (EOS), to characterizing an ultrawide band amplifier is also demonstrated.

本文言語英語
ホスト出版物のタイトルIEEE LEOS Annual Meeting - Proceedings
出版社IEEE
ページ203-204
ページ数2
2
出版ステータス出版済み - 1994
外部発表はい
イベントProceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2) - Boston, MA, USA
継続期間: 10 31 199411 3 1994

その他

その他Proceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2)
CityBoston, MA, USA
Period10/31/9411/3/94

All Science Journal Classification (ASJC) codes

  • 工学(全般)

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