2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

A. Shimizu, T. Ido, M. Kurachi, R. Makino, M. Nishiura, S. Kato, A. Nishizawa, Y. Hamada

研究成果: Contribution to journalArticle査読

3 被引用数 (Scopus)

抄録

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.

本文言語英語
論文番号11D853
ジャーナルReview of Scientific Instruments
85
11
DOI
出版ステータス出版済み - 11 2014

All Science Journal Classification (ASJC) codes

  • Instrumentation

フィンガープリント 「2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル