2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device

A. Shimizu, T. Ido, M. Nishiura, S. Kato, K. Ogawa, H. Takahashi, H. Igami, Y. Yoshimura, S. Kubo, T. Shimozuma

研究成果: Contribution to journalArticle査読

4 被引用数 (Scopus)

抄録

Two-dimensional spatial profiles of potential fluctuation were measured with the heavy ion beam probe (HIBP) in the Large Helical Device (LHD). For 2D spatial profile measurements, the probe beam energy has to be changed, which requires the adjustment of many deflectors in the beam transport line to optimize the beam trajectory, since the transport line of LHD-HIBP system is long. The automatic beam adjustment system was developed, which allows us to adjust the beam trajectory easily. By analyzing coherence between potential fluctuation and magnetic probe signal, the noise level of the mode power spectrum of the potential fluctuation can be reduced. By using this method, the 2D spatial profile of potential fluctuation profile was successfully obtained.

本文言語英語
論文番号11E731
ジャーナルReview of Scientific Instruments
87
11
DOI
出版ステータス出版済み - 11 1 2016
外部発表はい

All Science Journal Classification (ASJC) codes

  • 器械工学

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