TY - JOUR
T1 - 3D image analysis for evaluating internal deformation/fracture characteristics of materials
AU - Nakazawa, Mitsuru
AU - Aoki, Yoshimitsu
AU - Toda, Hiroyuki
AU - Kobayashi, Masakazu
PY - 2008/12/1
Y1 - 2008/12/1
N2 - In the past, all methods which understand deformation/fracture (D/F) characteristics have been limited on the surface indirectly. D/F characteristics are impacted by nano-scale structural features like air bubbles (pores); therefore, they need to be analyzed including inside. In this paper, we propose a system which automatically obtains the corresponding relations between pre- and post-D/F pores. Our system enabled analyzing three-dimensional, local, high-accuracy D/F characteristics.
AB - In the past, all methods which understand deformation/fracture (D/F) characteristics have been limited on the surface indirectly. D/F characteristics are impacted by nano-scale structural features like air bubbles (pores); therefore, they need to be analyzed including inside. In this paper, we propose a system which automatically obtains the corresponding relations between pre- and post-D/F pores. Our system enabled analyzing three-dimensional, local, high-accuracy D/F characteristics.
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U2 - 10.1002/ecj.1005
DO - 10.1002/ecj.1005
M3 - Article
AN - SCOPUS:62249179956
VL - 91
SP - 16
EP - 23
JO - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
JF - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
SN - 8756-663X
IS - 12
ER -