抄録
A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP.
本文言語 | 英語 |
---|---|
論文番号 | 10F523 |
ジャーナル | Review of Scientific Instruments |
巻 | 77 |
号 | 10 |
DOI | |
出版ステータス | 出版済み - 2006 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 器械工学