6 MeV heavy ion beam probe on the Large Helical Device

T. Ido; A. Shimizu; M. Nishiura; A. Nishizawa; S. Katoh; K. Tsukada; M. Yokota; H. Ogawa; T. Inoue; Y. Hamada; T. P. Crowley

doi:10.1063/1.2338311

6 MeV heavy ion beam probe on the Large Helical Device

T. Ido, A. Shimizu, M. Nishiura, A. Nishizawa, S. Katoh, K. Tsukada, M. Yokota, H. Ogawa, T. Inoue, Y. Hamada, T. P. Crowley

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

40 被引用数 (Scopus)

抄録

A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP.

本文言語	英語
論文番号	10F523
ジャーナル	Review of Scientific Instruments
巻	77
号	10
DOI	https://doi.org/10.1063/1.2338311
出版ステータス	出版済み - 2006
外部発表	はい

!!!All Science Journal Classification (ASJC) codes

器械工学

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10.1063/1.2338311

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title = "6 MeV heavy ion beam probe on the Large Helical Device",

abstract = "A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP.",

author = "T. Ido and A. Shimizu and M. Nishiura and A. Nishizawa and S. Katoh and K. Tsukada and M. Yokota and H. Ogawa and T. Inoue and Y. Hamada and Crowley, {T. P.}",

year = "2006",

doi = "10.1063/1.2338311",

language = "English",

volume = "77",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

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TY - JOUR

T1 - 6 MeV heavy ion beam probe on the Large Helical Device

AU - Ido, T.

AU - Shimizu, A.

AU - Nishiura, M.

AU - Nishizawa, A.

AU - Katoh, S.

AU - Tsukada, K.

AU - Yokota, M.

AU - Ogawa, H.

AU - Inoue, T.

AU - Hamada, Y.

AU - Crowley, T. P.

PY - 2006

Y1 - 2006

N2 - A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP.

AB - A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP.

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UR - http://www.scopus.com/inward/citedby.url?scp=33750495621&partnerID=8YFLogxK

U2 - 10.1063/1.2338311

DO - 10.1063/1.2338311

M3 - Article

AN - SCOPUS:33750495621

VL - 77

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 10

M1 - 10F523

ER -

6 MeV heavy ion beam probe on the Large Helical Device

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!!!All Science Journal Classification (ASJC) codes

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