抄録
Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
本文言語 | 英語 |
---|---|
ページ(範囲) | 231-237 |
ページ数 | 7 |
ジャーナル | Surface Science |
巻 | 246 |
号 | 1-3 |
DOI | |
出版ステータス | 出版済み - 4月 3 1991 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜
- 材料化学