抄録
Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
| 本文言語 | 英語 |
|---|---|
| ページ（範囲） | 231-237 |
| ページ数 | 7 |
| ジャーナル | Surface Science |
| 巻 | 246 |
| 号 | 1-3 |
| DOI | |
| 出版ステータス | 出版済み - 4月 3 1991 |
| 外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜
- 材料化学