Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry