A CP mask development methodology for MCC systems

Makoto Sugihara, Taiga Takata, Kenta Nakamura, Yusuke Matsunaga, Kazuaki Murakami

研究成果: ジャーナルへの寄稿Conference article

8 引用 (Scopus)

抄録

The character projection (CP) is utilized for maskless lithography and is a potential for the future photomask manufacture because the CP can project ICs faster than the point beam projection and the variable-shaped beam (VSB) projection. The drawback of the CP is its lower throughput than that of photomask-based lithography and the amortization cost of CP equipment leads to the price rise of ICs. This paper discusses a CP mask development methodology for increasing the throughput of MCC systems. The proposed methodology virtually increases the number of the logic cells which are projected with the CP. In the proposed methodology, the multiform CP masks are utilized among the column-cells for reducing the VSB projection. The experimental results show that the proposed CP mask development methodology reduced 71.3% of the number of EB shots needed for an SCC system. It also reduced 42.6% of the number of EB shots needed for the MCC system in which uniform CP masks are utilized for all column-cells.

元の言語英語
記事番号62833J
ジャーナルProceedings of SPIE - The International Society for Optical Engineering
6283 II
DOI
出版物ステータス出版済み - 9 4 2006
イベントPhotomask and Next-Generation Lithography Mask Technology XIII - Yokohama, 日本
継続期間: 4 18 20064 20 2006

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Mask
Masks
masks
projection
Projection
methodology
Photomasks
Methodology
Lithography
Throughput
Photomask
photomasks
shot
Character
Cell
lithography
cells
Maskless Lithography
Costs
logic

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

これを引用

A CP mask development methodology for MCC systems. / Sugihara, Makoto; Takata, Taiga; Nakamura, Kenta; Matsunaga, Yusuke; Murakami, Kazuaki.

:: Proceedings of SPIE - The International Society for Optical Engineering, 巻 6283 II, 62833J, 04.09.2006.

研究成果: ジャーナルへの寄稿Conference article

Sugihara, Makoto ; Takata, Taiga ; Nakamura, Kenta ; Matsunaga, Yusuke ; Murakami, Kazuaki. / A CP mask development methodology for MCC systems. :: Proceedings of SPIE - The International Society for Optical Engineering. 2006 ; 巻 6283 II.
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