A fast test pattern generation for large scale circuits

Yusuke Matsunaga, Masahiro Fujita

研究成果: Contribution to journalArticle査読

1 被引用数 (Scopus)

抄録

This paper describes a fast test pattern generator for large combinational circuit refining existing algorithms, the system can detect testable faults and identify redundant faults more effectively and mor efficiently. Three major contributions are presented in the paper, which are a fast growing algorithm finding path controllers, circuit narrowing technique and global implication based on equivalence. These modifications are described in detail and experimental results using ISCAS benchmark circuits are shown.

本文言語英語
ページ(範囲)305-311
ページ数7
ジャーナルFujitsu Scientific and Technical Journal
29
3
出版ステータス出版済み - 9 1993
外部発表はい

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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