A fault detection and diagnosis for the continuous process with load-fluctuations using orthogonal wavelets

Y. Tsuge, K. Hiratsuka, K. Takeda, H. Matsuyama

研究成果: Contribution to journalConference article査読

14 被引用数 (Scopus)

抄録

Fault detection and diagnosis of a continuous process with input fluctuations such as load fluctuations can not be simply performed because of the difficulty of detecting the abnormality in the process, where normal values of state variables are uncertainly time-varying according to the input fluctuations. In this study, normal values of output variables are predicted by the use of the approximation function that is drawn from a family of orthogonal wavelets. Measured value of an output variable is classified to five-range signs (+, +?, 0, -?, -) by simultaneously performing two sequential probability ratio tests (SPRTs) based on the error residual between predicted and measured values: one test examines whether it is normal or higher than normal, the other examines whether it is normal or lower than normal. A combination of signs given to all the output variables is called a pattern, which is considered to represent an abnormal situation occurring in the process. Then, the fault diagnosis algorithm, based on signed directed graph (SDG), can deduce the fault origin that causes the pattern. The effectiveness of this approach is demonstrated through experiments by a tank-pipeline system. (C) 2000 Elsevier Science Ltd.

本文言語英語
ページ(範囲)761-767
ページ数7
ジャーナルComputers and Chemical Engineering
24
2-7
DOI
出版ステータス出版済み - 7 15 2000
イベント7th International Symposium on Process Systems Engineering - Keystone, CO, USA
継続期間: 7 16 20007 21 2000

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Computer Science Applications

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