A GA-based method for high-quality X-filling to reduce launch switching activity in at-speed scan testing

Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

8 被引用数 (Scopus)

抄録

Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the quality of previous X-filling methods for reducing launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this quality problem with a novel, GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner, and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on benchmark and industrial circuits, and initial results have demonstrated the usefulness of GA-fill.

本文言語英語
ホスト出版物のタイトル2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009
ページ81-86
ページ数6
DOI
出版ステータス出版済み - 2009
イベント2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009 - Shanghai, 中国
継続期間: 11 16 200911 18 2009

出版物シリーズ

名前2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009

その他

その他2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009
国/地域中国
CityShanghai
Period11/16/0911/18/09

All Science Journal Classification (ASJC) codes

  • 計算理論と計算数学
  • ソフトウェア

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