A new method to analyze density fluctuation by microwave reflectometry

Kouji Shinohara, Syun'ichi Shiraiwa, Katsumichi Hoshino, Yukitoshi Miura, Kazuaki Hanada, Hiroshi Toyama

研究成果: Contribution to journalArticle査読

11 被引用数 (Scopus)

抄録

The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

本文言語英語
ページ(範囲)7367-7374
ページ数8
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
36
12 A
DOI
出版ステータス出版済み - 12 1997
外部発表はい

All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(全般)

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