Fe(Te xS y) films were fabricated on (100) SrTiO 3 substrates from Fe(Te 0.65S 0.16) amorphous precursors by a solid phase epitaxial growth process under various background atmospheric conditions. Structural analysis by x-ray diffraction showed strong peaks corresponding to Fe(Te xS y) phases, when the amorphous precursors were heated with Fe(Te 0.8S 0.2) sintered pellets. The crystallinity of the films deteriorated at longer periods of heating but the compositional shifts were found to have decreased. Consequently, the critical temperature, T Czero, of the Fe(Te xS y) film with minimum compositional shift was found to be 9.0K and critical current density, J C, of the film was about 1.4×10 4Acm 2.
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