抄録
In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.
本文言語 | 英語 |
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ページ | 1979-1984 |
ページ数 | 6 |
DOI | |
出版ステータス | 出版済み - 12月 1 2009 |
外部発表 | はい |
イベント | 35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009 - Porto, ポルトガル 継続期間: 11月 3 2009 → 11月 5 2009 |
その他
その他 | 35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009 |
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国/地域 | ポルトガル |
City | Porto |
Period | 11/3/09 → 11/5/09 |
!!!All Science Journal Classification (ASJC) codes
- 制御およびシステム工学
- 電子工学および電気工学