A statistical approach to correct x-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements

Kenichi Kato, Yoshihito Tanaka, Miho Yamauchi, Koji Ohara, Takaki Hatsui

研究成果: ジャーナルへの寄稿記事

1 引用 (Scopus)

抄録

An unbiased approach to correct X-ray response non-uniformity in microstrip detectors has been developed based on the statistical estimation that the scattering intensity at a fixed angle from an object is expected to be constant within the Poisson noise. Raw scattering data of SiO2 glass measured by a microstrip detector module was found to show an accuracy of 12σPN at an intensity of 106 photons, where σPN is the standard deviation according to the Poisson noise. The conventional flat-field calibration has failed in correcting the data, whereas the alternative approach used in this article successfully improved the accuracy from 12σPN to 2σPN. This approach was applied to total-scattering data measured by a gapless 15-modular detector system. The quality of the data is evaluated in terms of the Bragg reflections of Si powder, the diffuse scattering of SiO2 glass, and the atomic pair distribution function of TiO2 nanoparticles and Ni powder.

元の言語英語
ページ(範囲)762-773
ページ数12
ジャーナルJournal of Synchrotron Radiation
26
発行部数3
DOI
出版物ステータス出版済み - 5 2019

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nonuniformity
Scattering
Detectors
X rays
high resolution
detectors
scattering
x rays
Powders
Glass
glass
Distribution functions
standard deviation
Photons
modules
distribution functions
Calibration
Nanoparticles
nanoparticles
photons

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

これを引用

A statistical approach to correct x-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements. / Kato, Kenichi; Tanaka, Yoshihito; Yamauchi, Miho; Ohara, Koji; Hatsui, Takaki.

:: Journal of Synchrotron Radiation, 巻 26, 番号 3, 05.2019, p. 762-773.

研究成果: ジャーナルへの寄稿記事

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