@inproceedings{839d2996c4884824b03b448c7aaf81cf,
title = "A study of the reliability of mosfets in two stacked thin chips for 3D system in package",
author = "Akihiro Ikeda and Yosuke Sugimoto and Tomonori Kuwada and Satoru Kajiwara and Tsuyoshi Fujimura and Kazuya Iwasaki and Hiroshi Ogi and Kiyoshi Hamaguchi and Hisao Kuriyaki and Reiji Hattori and Yukinori Kuroki",
year = "2005",
month = dec,
day = "15",
language = "English",
isbn = "0780388038",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "578--579",
booktitle = "2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual",
note = "2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual ; Conference date: 17-04-2005 Through 21-04-2005",
}