Transient creep at very low strain rates (less than 10-10s -1) is still unclear. The traditional uniaxial creep testing is less useful due to unsatisfied resolution strain ∼(10-6). To study transient creep behavior at such low strain rates, a high-resolution strain measurement using the helicoid spring specimen technique was employed in a fine-grained Al-5356 alloy at temperatures ranging from 0.47 Tm to 0.74Tm (Tm: melting point). To clarify transient creep mechanism at such low strain rates, transmission electron microscopy (TEM) was used in microstructure observation of crept specimens. The abnormal transient creep, high temperature strengthening at T>Tp(Tp: the phase transformation temperature, 0.58Tm) or intermediate temperature softening at 0.4Tm<T≤Tp and double-normal type (creep curves including double work-hardening stages) at T=Tp, were firstly observed. The substructure observation in a crept specimen at T=0.58Tm and É=1*10-4 shows pile-up dislocations including many small jogs with equal interval, and dislocations emitted from grain boundaries. The β-Al3Mg2 phase dissolves under the condition of testing temperatures higher than 523 K, which causes solid-solution quantity of Mg atoms to increase. Therefore, the "abnormal transient creep" may be related to the difference of solid solution strengthening caused by phase change during the creep tests.
|ジャーナル||Transactions of Nonferrous Metals Society of China (English Edition)|
|出版ステータス||出版済み - 5月 2013|
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