Advanced form of ζ-factor method in analytical electron microscopy

Takeshi Fujita, Masashi Watanabe, Zenji Horita, Minoru Nemoto

研究成果: ジャーナルへの寄稿記事

3 引用 (Scopus)

抜粋

This study describes development of the ζ-factor method proposed earlier. The development is attempted by incorporating the absorption correction term into the equation relating the mass thickness to the characteristic X-ray intensity. It is shown that the advanced form of the ζ-factor method reduces restriction encountered by the earlier form and thus enhances applicability of the ζ-factor method. The advanced form is applied to the Ni-Al binary system and the Ti-Al-Cr ternary system. This application demonstrates the validity of the advanced form of the ζ-factor method. The relation between the ζ factor and the k factor is discussed and an advantage of using the ζ-factor method is summarized.

元の言語英語
ページ(範囲)561-568
ページ数8
ジャーナルJournal of Electron Microscopy
48
発行部数5
DOI
出版物ステータス出版済み - 1 1 1999

    フィンガープリント

All Science Journal Classification (ASJC) codes

  • Instrumentation

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