An application of the differential X-ray absorption method to thickness measurement in precipitate-containing Ni3(Al, Ti) and tial compounds

W. H. Tian, Z. Horita, T. Sano, M. Nemoto

    研究成果: Contribution to journalArticle査読

    1 被引用数 (Scopus)

    抄録

    The differential X-ray absorption (DXA) method is applied to the thickness measurement of the two types of intermetallic compound, Ni3(Al, Ti) and TiAl, containing finely dispersed precipitate particles. It is shown that the DXA method is applicable even in the presence of particles with coherent strain fields where it is not possible to use the convergent-beam electron diffraction method. It is proposed that the absorption-free intensity ratio required for the DXA method can be determined using the extrapolation method without knowledge of specimen compositions.

    本文言語英語
    ページ(範囲)811-822
    ページ数12
    ジャーナルPhilosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
    67
    6
    DOI
    出版ステータス出版済み - 6 1993

    All Science Journal Classification (ASJC) codes

    • 化学工学(全般)
    • 物理学および天文学(全般)

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