Analysis and minimization of test time in a combined BIST and external test approach

Makoto Sugihara, Hiroshi Date, Hiroto Yasuura

研究成果: ジャーナルへの寄稿Conference article

37 引用 (Scopus)

抜粋

In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.

元の言語英語
記事番号840029
ページ(範囲)134-140
ページ数7
ジャーナルProceedings -Design, Automation and Test in Europe, DATE
DOI
出版物ステータス出版済み - 12 1 2000
イベントDesign, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 - Paris, フランス
継続期間: 3 27 20003 30 2000

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

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