In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.
|ジャーナル||Proceedings -Design, Automation and Test in Europe, DATE|
|出版物ステータス||出版済み - 12 1 2000|
|イベント||Design, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 - Paris, フランス|
継続期間: 3 27 2000 → 3 30 2000
All Science Journal Classification (ASJC) codes